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2011年SIECC独家提供留学服务细节 体验超值服务!
2011年SIECC十万奖学金奖励新加坡优秀留学生!(2011-7-10)- 新加坡南洋理工大学世界排名上升 (2011-10-9)
- 新加坡南洋理工大学2011届毕业生中国毕业典礼在黑龙江举行 (2011-9-1)
- 新加坡南洋理工大学天津研究生院拟后年开学 (2011-8-15)
- 新加坡南洋理工大学毕业典礼老师恩情铭记在心 ——两“许文辉优秀生奖”得主 (2011-7-27)
- 2010年最新全球大学排名 新加坡南洋理工大学全球排名TOP74!
新加坡南洋理工大学硕士项目2011/2012届录取结果揭晓!- 新加坡南洋理工大学硕士项目2010/2011届录取结果揭晓!
- 新加坡南洋理工大学硕士项目2009/2010届录取结果揭晓!
- 新加坡南洋理工大学硕士项目2008/2009届录取结果揭晓!
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来源:NTU
Overview of Programme
The MSc (Electronics) programme is offered on a part-time and full-time basis for engineers in the electronics industry who would like to have graduate training in various topics, amongst others, in integrated circuit design, microelectronics fabrication and manufacture of electronic and photonic products.
Curriculum structure
The lectures are conducted in the evenings. The degree requires satisfactory completion of a total of 30 AUs. This may be fulfilled in two different ways:
Four core and four elective courses with 3 AUs each and a dissertation of 6 AUs. The project for the dissertation may be undertaken either in NTU or in the industry.
Four core and five elective courses with 3 AUs each and an Independent Study Module (ISM) of 3 AUs.
Part-time candidates typically register for two courses per semester, while full-time candidates register for four courses.
Core Courses
EE6306 Digital IC Design
EE6601 Advanced Wafer Processing
EE6602 Quality and Reliability Engineering
EE6604 Advanced Topics in Semiconductor Devices
Elective Courses (select any 4 or 5 courses)
EE6307 Analog IC Design
EE6303 Electromagnetic Compatibility and Interference
EE6328 Signal Integrity in High-Speed Digital Systems
EE6608 Advanced Semiconductor Physics
EE6610 IC Packaging
EE6617 Nanoelectronics
EE6802 Laser Technology and Applications
EE6801 Modern Optics
EE6808 Display Technologies
EE6401 Advanced Digital Signal Processing
EE6203 Computer Control Systems
EE6506 Power Semiconductor & Passive Devices
ES6102 Advanced Digital system design
ES6103 Embedded System Programming
CONTENT OF SUBJECTS 部分课程
EE6306
DIGITAL IC DESIGN
Review of Integrated Circuit Fundamentals. Layout and Design Issues. CMOS Digital Circuits. BiCMOS Digital Circuits. Sub-System Design in Digital Circuits. Design Methodologies.
EE6307
ANALOG IC DESIGN
Review of Fundamentals. Analog Building Blocks. Switched Capacitor Circuits. Current Mode Circuits. Continuous-Time Filters. Data Converters and Mixed Signal Techniques.
EE6308
RF IC DESIGN
System Design Considerations. CMOS RF Components and Devices. Low-noise amplifier (LNA); Mixers; Voltage-controlled oscillators (VCOs). RF power amplifiers. Phase-Locked Loops and Frequency Synthesizers.
EE6328
SIGNAL INTEGRITY IN HIGH-SPEED DIGITAL SYSTEMS
High speed properties of logic gates. Modeling and analysis of interconnections. Transmission lines and terminations. Power distribution networks and ground planes. Clock distribution. Case study.
EE6601
ADVANCED WAFER PROCESSING
Thin film deposition. Chemical and mechanical polishing. Lithography and resist technology. Etching process and technology. Cleaning technology. Process integration. Metrology and analytical techniques.
EE6602
QUALITY & RELIABILITY ENGINEERING
Quality management and planning. Statistical process control. Design of experiments. Reliability planning & statistical framework. Burn-in, FMEA and accelerated testing.
EE6604
ADVANCED TOPICS IN SEMICONDUCTOR DEVICES
Bipolar transistor operating principles. Bipolar device modelling. State-of-the-art bipolar structures. MOS device operation. MOSFET modelling. MOS device scaling effects. Semiconductor memories. Semiconductor heterojunctions. Future trends and challenges.
EE6605
SUB-MICRON SEMICONDUCTOR PROCESS & DEVICE SIMULATION
The subject will cover the design and simulation for sub-micron integrated circuits and their fabrication. There will be virtual wafer fabrication, virtual device characterization and virtual process integration modules. The students will be required to carry out the design with hands-on project exercises through the use of simulation software packages.
EE6606
FAILURE MECHANISMS IN SEMICONDUCTOR DEVICES
Introduction to Failure Mechanisms. Bulk failure mechanism of semiconductor devices. Dielectric failure mechanisms of semiconductor devices. Metalization failure mechanisms of semiconductor devices. Interface failure mechanisms of semiconductor devices. Reliability testing.
EE6608
ADVANCED SEMICONDUCTOR PHYSICS
Crystal structure. Energy bands of semiconductors. Doping and carrier concentrations. Electrical transport phenomena. High field effects. Optical and thermal properties. Quantum size effects.
EE6609
HIGH-SPEED SEMICONDUCTOR DEVICES
Fundamentals of heterojunction devices. Material growth and device processing techniques. Advanced field effect transistors. Heterojunction bipolar transistors. Hot-electron and quantum-effect devices. Characterization and measurement techniques.
EE6610
INTEGRATED CIRCUIT PACKAGING
Plastic packaging materials. Manufacturing processes for plastic encapsulated microelectronics. State-of-the-art packaging techniques. Failure mechanisms, sites and modes. Qualification process and accelerated testing. Effects of packaging on the electrical performance. Future trends and challenges.
EE6614
SENSORS & ACTUATORS
Introduction. Dielectric Phenomena and Models. Semiconducting Phenomena in Electronic Ceramics and Sensors. Piezoelectric, Electrostriction and Pyroelectric Sensors and Actuators. Optical Phenomena and Applications. Magnetic Phenomena and Applications. Sensor and Actuator Systems.
EE6615
Microelectromechanical Systems (MEMS) Technology
Overview. MEMS Fabrication Technology. MEMS Design, Simulation and Layout. Electronic Interfaces, Packaging and Testing. MEMS Devices and Applications.
EE6616
CMOS Wafer Fabrication and Device Characterization
Hands-on experience in the clean room to fabricate CMOS transistors, MOS capacitors and other devices starting from bare silicon wafers. Electrical measurements and device characterization of CMOS devices. Clean Room Design and Protocol. Laboratory Safety. Wafer Cleaning. Thermal Oxidation and Thermal Diffusion. Photolithography. Wet Etching and Plasma Dry Etching. Ion Implantation. Thin Film Deposition. Metallization. Process Integration. Metrology. SEM, Microscopes, Use of semiconductor parameter analyzer, Electrical Measurements and Device Characterization.
EE6617
Nanoelectronics
Introduction to Nanotechnology. Synthesis of Nanomaterials. Lithography. Analysis and Manipulation Methods. Carbon Nanotubes and its applications. Quantum Computing.
EE6803
Optical Electronic Devices
Dielectric Photonic Materials. Integrated Optics. Light Modulation and Switching. Optical Detection. Device for Optical Communications.
EE6807
Compound Semiconductor Epitaxial GrowthTechnology
Epitaxy Technology and Growth Mechanisms. Liquid Phase Epitaxy (LPE). Metallorganic Chemical Vapour Deposition (MOCVD). Molecular Beam Epitaxy (MBE). Material Characterization. Semiconductor Microstructures and Applications.
EE6808
Display Technologies
Electronic Information Displays. Passive Matrix Liquid Crystal Displays. Active Matrix Liquid Crystal Displays. Plasma Display Panels. Organic Light-Emitting Devices. Field Emission Displays. Electroluminescent Displays and Electrochromic Displays. Emerging Display Technologies.

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恭喜!王同学 获得 [ 新加坡国立大学 ] 硕士OFFER!(4)(2011-08-9)




















